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Electron microscopes are instruments that use a beam of electrons to provide a high resolution image. Techniques include scanning, transmission and focused ion beam electron microscopy, and X-ray microtomography. Available in desktop size.
70° low profile SEM specimen mount for use with FEI, Tescan, Zeiss, Philips, LEO, Cambridge, AMRAY, Leica, CamScan, ETEC. Made from ultra-pure aluminum. Head: 1/2" Pin height: 3/8"
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Circlips are for all EMS TEM sample holders and specimen rods. They are made from heat treated Beryllium copper. The Circlip extraction tool is for removing our Circlips from all TEM sample holders.
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
SPM calibration specimens are produced by holographic fabrication that assures high accuracy and precision. The standards provide easier testing of your SPM, improved accuracy of critical dimension measurements and accuracy of 0.5% (1 std. dev.). The pattern height of greater than 100nm provides excellent image contrast. There is uniform coverage of entire chip which allows for imaging anywhere on the chip. Array of Posts. Pitch 297. Al bumps on Si. Use contact or TappingMode. Mount: Choose a mount
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More
Mini SEM stub specimen mount with shorter pin (6 mm) for use with all Zeiss/LEO scanning electron microscopes, FE-SEMs & FIB systems. Made of stainless steel. Head: 6.6 x 1.3 mm Pin height: 6.25 mm
Encompass Procurement Services Non-distribution item offered as a customer accommodation; additional freight charges may apply. Learn More